Glass Packaging and Its Reliability

Dr. John H. Lau

Chief Scientist, Unimicron Technology Corporation, Taiwan, China      

Abstract: 

In the past few years, because of the high-performance computing (HPC) driven by artificial intelligence (AI) and data centers in AI era, glass packaging has been attracting lots of traction. For example, among others, Intel's one-trillion transistors application processor with glass-core substrate to be shipped by the end of 2030 (announced on September 18, 2023) and TSMC's chip-on-panel-on-substrate (CoPoS) with glass-core interposer to be shipped in Q1 of 2029 (announced on April 23, 2025). In this lecture, a brief fundamental of through-glass via (TGV) and redistribution-layers (RDLs) of glass packaging will be presented. The advantages and disadvantages of glass, silicon, and organic will be discussed. Panel-level packaging vs. wafer-level packaging and the panel size will also be provided. Finally, the effects of coefficient of thermal expansion (CTE) of glass-core substrate on the solder joint reliability on printed circuit board (PCB) will be presented. Some recommendations will be provided.

Speaker's Biography:

TBD