Applications and Practices of Ultrasonic Imaging Technology in Quality Control

  
  Dr. Gujin Hu

  Chief Scientist，Shaoxing Xinjiyuan Electronic Technology Co., Ltd.，China

Speaker's Biography: 

Research Fellow and PhD Supervisor at Shanghai Institute of Technical Physics, Chinese Academy of Sciences (CAS), he earned his doctoral degree from CAS. His research focuses on optoelectronic properties of wide-bandgap semiconductors, advanced materials and device physics, as well as fabrication and physical properties of ferroelectric materials.

He has presided over 8 national and provincial-level research programs, and participated in key national initiatives including the National 973 Program, 863 Program, and Major & Key Projects funded by the National Natural Science Foundation of China. He holds 9 authorized invention patents and has published more than 60 SCI-indexed papers.

He serves as a peer reviewer for internationally renowned journals such as Crystal Growth & Design and Applied Physics Letters, alongside the domestic journal Journal of Semiconductors. Dr. Hu boasts profound academic expertise and extensive engineering experience in the inspection and characterization of semiconductor materials and devices.