Transient radiation effects on packaged micro-systems

  
  Prof. Guohe Zhang

  Vice Dean and Professor of School of Microelectronics, Xi'an Jiaotong University, China

Abstract:

Advanced packaging technology has become a key approach for enhancing chip performance in the post-Moore era. As packaged micro-systems are increasingly deployed in harsh environments, their transient radiation effects have attracted growing attention. This report will begin with a brief introduction to the new materials, processes, and structures introduced by advanced packaging technologies, along with the radiation effect issues they entail. Then, it will present research progress by our institution in the field of transient radiation effects on packaged micro-systems, including transient γ dose rate effect, electromagnetic pulse effect, and single-event effect. Finally, key factors influencing the transient radiation effects of packaged micro-systems will be summarized, and the research trends will be discussed.

Speaker's Biography: 

Professor Zhang Guohe serves as Deputy Director of the Shaanxi Key Laboratory of Electronic Devices and High-End Chips. His main research focuses on the basic theory of semiconductor devices and integrated circuit design. He has led or participated in a number of national-level projects, including the National Major Special Project for "Core Electronic Devices, High-End General-Purpose Chips and Basic Software Products" , National Key R&D Program, and National Natural Science Foundation of China. He has published over 100 papers in authoritative journals and academic conferences in this field, and holds more than 30 authorized invention patents.Professor Zhang has won several important awards, including the Second Prize of National Teaching Achievement Award (Undergraduate Education), the Special Prize of Shaanxi Provincial Teaching Achievement Award, and the First Prize of Shaanxi Provincial Science and Technology Progress Award.