Research on Failure Mechanism and Reliability Evaluation of TSV-Based 3D Integrated System

Dr. Guoguang LU

Researcher, China Electronic Product Reliability and Environmental Testing Research Institute     

Speaker Biography:

Researcher Guoguang Lu serves as the Deputy Director of the National Key Laboratory of Component Reliability Technology of China Electronic Product Reliability and Environmental Testing Research Institute. In recent years, He has led nearly 20 major research projects at both national and provincial/ministerial levels. His achievements include developing a series of 30 independently researched optoelectronic luminescent device reliability testing instruments, which broke the international technological monopoly. The overall technical specifications of these instruments have reached internationally advanced levels. Additionally, he pioneered a comprehensive 'integrated' evaluation technology for key component reliability within China, which is based on Microscopic defect localization, Failure mechanism analysis, Key parameter characterization, Accelerated life assessment and Reliability design enhancement. This integrated approach enables the realization of understandable failure mechanisms, identifiable microscopic defects, actionable quantitative assessment and controllable quantitative design, which has provided crucial support for advancing the independent development of highly reliable domestic key components and enabling their large-scale application. His related research accomplishments have been recognized with numerous awards, including a first prize of the Guangdong Science and Technology Progress Award, two National Innovation Team Awards, two Second Prizes and two Third Prizes for the provincial level, and one Guangdong Outstanding Patent Award. Up to now, he has been granted 6 invention patents and published over 60 papers.