The Study of Warpage and Micro-Structure Measurement with Optical Metrological Technologies in Advanced Packaging Process

Dr. Joonho You

CEO, Nexensor Inc.   

Speaker Biography:

Joonho You is currently the CEO of Nexensor Inc. He studied optical measurement at KAIST (Korea Advanced Institute of Science and Technology) and has over 20 years of experience in research, development, and commercialization in this field. His research interests include interferometry technology, thin-film measurement technology, shape measurement techniques using pattern projection methods such as deflectometry and Moiré, and fiber optic-based thickness sensors.